[ACM Press the Second ACM-IEEE international symposium - Kaiserslautern, Germany (2008.10.09-2008.10.10)] Proceedings of the Second ACM-IEEE international symposium on Empirical software engineering and measurement - ESEM '08 - Ensemble of software defect predictors
Tosun, Ayse, Turhan, Burak, Bener, AyseYear:
2008
Language:
english
DOI:
10.1145/1414004.1414066
File:
PDF, 195 KB
english, 2008