[ACM Press the 15th ACM SIGKDD international conference -...

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[ACM Press the 15th ACM SIGKDD international conference - Paris, France (2009.06.28-2009.07.01)] Proceedings of the 15th ACM SIGKDD international conference on Knowledge discovery and data mining - KDD '09 - Efficiently learning the accuracy of labeling sources for selective sampling

Donmez, Pinar, Carbonell, Jaime G., Schneider, Jeff
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Year:
2009
Language:
english
DOI:
10.1145/1557019.1557053
File:
PDF, 712 KB
english, 2009
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