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[ACM Press the ACM international conference companion - Reno/Tahoe, Nevada, USA (2010.10.17-2010.10.21)] Proceedings of the ACM international conference companion on Object oriented programming systems languages and applications companion - SPLASH '10 - Mutation analysis vs. code coverage in automated assessment of students' testing skills
Aaltonen, Kalle, Ihantola, Petri, Seppälä, OttoYear:
2010
Language:
english
DOI:
10.1145/1869542.1869567
File:
PDF, 348 KB
english, 2010