Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs
Peng, Huan-Kai, Huang, Hsuan-Ming, Kuo, Yu-Hsin, Wen, Charles H.-P.Volume:
17
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/2071356.2071365
Date:
January, 2012
File:
PDF, 917 KB
english, 2012