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[ACM Press the 32nd ACM/IEEE conference - San Francisco, California, United States (1995.06.12-1995.06.16)] Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 - On test set preservation of retimed circuits
El-Maleh, Aiman, Marchok, Thomas, Rajski, Janusz, Maly, WojciechYear:
1995
Language:
english
DOI:
10.1145/217474.217526
File:
PDF, 250 KB
english, 1995