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[ACM Press the 3rd international workshop - Berlin, Germany (2013.11.04-2013.11.04)] Proceedings of the 3rd international workshop on Trustworthy embedded devices - TrustED '13 - Bias-based modeling and entropy analysis of PUFs
van den Berg, Robbert, Skoric, Boris, van der Leest, VincentYear:
2013
Language:
english
DOI:
10.1145/2517300.2517301
File:
PDF, 3.68 MB
english, 2013