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[ACM Press the 52nd Annual Design Automation Conference - San Francisco, California (2015.06.07-2015.06.11)] Proceedings of the 52nd Annual Design Automation Conference on - DAC '15 - Design for low test pattern counts
Konuk, Haluk, Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Solanki, Deepak, Tyszer, Jerzy, Zawada, JustynaYear:
2015
Language:
english
DOI:
10.1145/2744769.2744817
File:
PDF, 388 KB
english, 2015