[ACM Press the 2014 IEEE/ACM International Symposium - Paris, France (2014.07.08-2014.07.10)] Proceedings of the 2014 IEEE/ACM International Symposium on Nanoscale Architectures - NANOARCH '14 - Fast process variation analysis in nano-scaled technologies using column-wise sparse parameter selection
Mohammadi, Hassan Ghasemzadeh, Gaillardon, Pierre-Emmanuel, Yazdani, Majid, De Micheli, GiovanniYear:
2014
Language:
english
DOI:
10.1145/2770287.2770327
File:
PDF, 772 KB
english, 2014