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[ACM Press the 1998 IEEE/ACM international conference - San Jose, California, United States (1998.11.08-1998.11.12)] Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design - ICCAD '98 - Efficient transient electrothermal simulation of CMOS VLSI circuits under electrical overstress
Li, Tong, Tsai, Ching-Han, Kang, Sung-Mo SteveYear:
1998
Language:
english
DOI:
10.1145/288548.288553
File:
PDF, 715 KB
english, 1998