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[ACM Press the 1998 IEEE/ACM international conference - San Jose, California, United States (1998.11.08-1998.11.12)] Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design - ICCAD '98 - Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
Boppana, Vamsi, Fuchs, W. KentYear:
1998
Language:
english
DOI:
10.1145/288548.288593
File:
PDF, 857 KB
english, 1998