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[ACM Press the 36th ACM/IEEE conference - New Orleans, Louisiana, United States (1999.06.21-1999.06.25)] Proceedings of the 36th ACM/IEEE conference on Design automation conference - DAC '99 - Built-in test sequence generation for synchronous sequential circuits based on loading and expansion of test subsequences
Pomeranz, Irith, Reddy, Sudhakar M.Year:
1999
Language:
english
DOI:
10.1145/309847.310052
File:
PDF, 47 KB
english, 1999