[ACM Press the 37th conference - Los Angeles, California, United States (2000.06.05-2000.06.09)] Proceedings of the 37th conference on Design automation - DAC '00 - Improved fault diagnosis in scan-based BIST via superposition
Bayraktaroglu, Ismet, Orailoğlu, AlexYear:
2000
Language:
english
DOI:
10.1145/337292.337311
File:
PDF, 79 KB
english, 2000