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[ACM Press the 37th conference - Los Angeles, California, United States (2000.06.05-2000.06.09)] Proceedings of the 37th conference on Design automation - DAC '00 - A methodology for modeling the effects of systematic within-die interconnect and device variation on circuit performance
Mehrotra, Vikas, Sam, Shiou Lin, Boning, Duane, Chandrakasan, Anantha, Vallishayee, Rakesh, Nassif, SaniYear:
2000
Language:
english
DOI:
10.1145/337292.337370
File:
PDF, 986 KB
english, 2000