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[ACM Press the conference - Paris, France (2000.03.27-2000.03.30)] Proceedings of the conference on Design, automation and test in Europe - DATE '00 - Design practices for better reliability and yield (tutorial)
Zorian, Yervant, Nicolaidis, Michael, Muhmenthaler, Peter, Lepejian, David, Strolenberg, Chris, Veelenturf, KeesYear:
2000
Language:
english
DOI:
10.1145/343647.343701
File:
PDF, 9 KB
english, 2000