Diagnostic simulation of stuck-at faults in sequential...

ACM Transactions on Design Automation of Electronic Systems 2001 / 10 Vol. 6; Iss. 4

Diagnostic simulation of stuck-at faults in sequential circuits using compact lists

Hartanto, Ismed, Venkataraman, Srikanth, Fuchs, W. Kent, Rudnick, Elizabeth M., Patel, Janak H., Chakravarty, Sreejit
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Volume:
6
Language:
english
Journal:
ACM Transactions on Design Automation of Electronic Systems
DOI:
10.1145/502175.502177
Date:
October, 2001
File:
PDF, 181 KB
english, 2001
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