[ACM Press the 40th conference - Anaheim, CA, USA (2003.06.02-2003.06.06)] Proceedings of the 40th conference on Design automation - DAC '03 - Coverage directed test generation for functional verification using bayesian networks
Fine, Shai, Ziv, AviYear:
2003
Language:
english
DOI:
10.1145/775832.775907
File:
PDF, 159 KB
english, 2003