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Structural Analysis of ZnO(:Al,Mg) Thin Films by X-ray Diffraction
Garcés, F.A., Budini, N., Koropecki, R.R., Arce, R.D.Volume:
8
Year:
2015
Language:
english
Journal:
Procedia Materials Science
DOI:
10.1016/j.mspro.2015.04.108
File:
PDF, 1.95 MB
english, 2015