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Perturbation method for dielectric constant measurement of thick-film dielectric materials at microwave frequencies
Li, D., Free, C.E., Pitt, K.E.G., Barnwell, P.G.Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19981392
File:
PDF, 98 KB
english, 1998