Neural network approach to fault diagnosis in CMOS opamps...

Electronics Letters 1994 / 04 Vol. 30; Iss. 9

Neural network approach to fault diagnosis in CMOS opamps with gate oxide short faults

Eckersall, K.R., Yu, S., Hall, A.G., Bell, I.M., Jervis, B.W., Taylor, G.E.
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Volume:
30
Journal:
Electronics Letters
DOI:
10.1049/el:19940472
Date:
April, 1994
File:
PDF, 197 KB
1994
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