Derived distribution for electrical overstress failure...

Derived distribution for electrical overstress failure thresholds of transistors

Wheless, W.P., Wurtz, L.T.
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Volume:
34
Year:
1998
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19981418
File:
PDF, 80 KB
english, 1998
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