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[AIP ELECTRON MICROSCOPY AND MULTISCALE MODELING- EMMM-2007: An International Conference - Moscow (Russia) (3–7 September 2007)] AIP Conference Proceedings - Cone-angle Dependence of Ab-initio Structure Solutions Using Precession Electron Diffraction
Ciston, James, Own, Christopher S., Marks, Laurence D., Avilov, Anatoly S., Dudarev, Sergei L., Marks, Laurence D.Volume:
999
Year:
2008
Language:
english
DOI:
10.1063/1.2918117
File:
PDF, 1.13 MB
english, 2008