Improvement in the determination by 1/f noise measurements of the interface state distribution in polysilicon thin film transistors in relation with the compensation law of Meyer Neldel
L. Pichon, A. Boukhenoufa, B. Cretu, R. RogelYear:
2009
Language:
english
DOI:
10.1063/1.3126706
File:
PDF, 890 KB
english, 2009