[AIP NOISE AND FLUCTUATIONS: 20th International Conference...

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[AIP NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009) - Pisa (Italy) (14–19 June 2009)] AIP Conference Proceedings - RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position

Sikula, J., Sedlakova, V., Chvatal, M., Pavelka, J., Tacano, M., Toita, M., Macucci, Massimo, Basso, Giovanni
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Year:
2009
Language:
english
DOI:
10.1063/1.3140431
File:
PDF, 616 KB
english, 2009
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