[AIP NOISE AND FLUCTUATIONS: 20th International Conference on Noice and Fluctuations (ICNF-2009) - Pisa (Italy) (14–19 June 2009)] AIP Conference Proceedings - RTS in Submicron MOSFETs: Lateral Field Effect and Active Trap Position
Sikula, J., Sedlakova, V., Chvatal, M., Pavelka, J., Tacano, M., Toita, M., Macucci, Massimo, Basso, GiovanniYear:
2009
Language:
english
DOI:
10.1063/1.3140431
File:
PDF, 616 KB
english, 2009