[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR...

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[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Contact Resistance Studies of Metal on HOPG and Graphene Stacks

Venugopal, Archana, Pirkle, Adam, Wallace, Robert M., Colombo, Luigi, Vogel, Eric M., Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold,
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Year:
2009
Language:
english
DOI:
10.1063/1.3251243
File:
PDF, 582 KB
english, 2009
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