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AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING - Monte Verita (Ascona) (16–21 May 2010)] - Accuracy of Sampling Moiré Method and the Application to Deflection Measurement of Large-scale Structures
Ri, Shien, Muramatsu, Takashi, Saka, Masumi, Nanbara, Kenichi, Kobayashi, Daisuke, Rastogi, Pramod K., Hack, ErwinYear:
2010
Language:
english
DOI:
10.1063/1.3426142
File:
PDF, 1.62 MB
english, 2010