![](/img/cover-not-exists.png)
AIP Conference Proceedings [AIP INTERNATIONAL CONFERENCE ON ADVANCES IN MATERIALS AND PROCESSING TECHNOLOGIES (AMPT2010) - Paris, (France) (24–27 October 2010)] - Characteristic Cutting Signals for Machined Surface Condition Monitoring in Micro milling Processes
Jang, Su-Hoon, Jang, Ik-Soo, Kim, Jeong-Suk, Choi, Tae-Ku, Gu, Min-Su, Chinesta, Francisco, Chastel, Yvan, El Mansori, MohamedYear:
2011
Language:
english
DOI:
10.1063/1.3552330
File:
PDF, 351 KB
english, 2011