AIP Conference Proceedings [AIP FRONTIERS OF...

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AIP Conference Proceedings [AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2011 - Grenoble (France) (23–26 May 2011)] - Observation of Work Functions, Metallicity, Band Bending, Interfacial Dipoles by EUPS for Characterizing High-k∕Metal Interfaces

Tomie, Toshihisa, Ishitsuka, Tomoaki, Ootsuka, Teruhisa, Ota, Hiroyuki, Seiler, David G., Diebold, Alain C., McDonald, Robert, Chabli, Amal, Secula, Erik M.
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Year:
2011
Language:
english
DOI:
10.1063/1.3657881
File:
PDF, 684 KB
english, 2011
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