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[AIP FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2009 - Albany (New York) (11–15 May 2009)] AIP Conference Proceedings - Automated crystal phase and orientation mapping of nanocrystals in a transmission electron microscope
Moeck, Peter, Rouvimov, Sergei, Rauch, Edgar F., Nicolopoulos, Stavros, Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.Year:
2009
Language:
english
DOI:
10.1063/1.3251240
File:
PDF, 2.63 MB
english, 2009