AIP Conference Proceedings [AIP THE PHYSICS OF SEMICONDUCTORS: Proceedings of the 31st International Conference on the Physics of Semiconductors (ICPS) 2012 - Zurich, Switzerland (29 July–3 August 2012)] - A new mechanism of contact resistance formation in ohmic contacts to semiconductors with high dislocation density
Sachenko, A. V., Belyaev, A. E., Boltovets, N. S., Konakova, R. V., Kudryk, Ya. Ya., Novitskii, S. V., Sheremet, V. N., Vinogradov, A. O., Li, J., Vitusevich, S. A.Year:
2013
Language:
english
DOI:
10.1063/1.4848285
File:
PDF, 400 KB
english, 2013