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AIP Conference Proceedings [AIP Publishing LLC 40TH ANNUAL REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION: Incorporating the 10th International Conference on Barkhausen Noise and Micromagnetic Testing - Baltimore, Maryland, USA (21–26 July 2013)] - Negative measurement sensitivity values of planar capacitive imaging probes
Yin, Xiaokang, Chen, Guoming, Li, Wei, Hutchins, DavidYear:
2014
Language:
english
DOI:
10.1063/1.4865000
File:
PDF, 865 KB
english, 2014