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AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Transient luminescence induced by electrical refilling of charge carrier traps of dislocation network at hydrophilically bonded Si wafers interface
Bondarenko, Anton, Vyvenko, OlegYear:
2014
Language:
english
DOI:
10.1063/1.4865602
File:
PDF, 520 KB
english, 2014