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AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Transition dynamics for Mu acceptor states in Si1–xGex alloys

Jayarathna, G., Lichti, R. L., Mengyan, P. W., Celebi, Y. G., Baker, B. B., Carroll, B. R., Yonenaga, I.
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Year:
2014
Language:
english
DOI:
10.1063/1.4865604
File:
PDF, 401 KB
english, 2014
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