AIP Conference Proceedings [AIP Publishing LLC INTERNATIONAL CONFERENCE ON DEFECTS IN SEMICONDUCTORS 2013: Proceedings of the 27th International Conference on Defects in Semiconductors, ICDS-2013 - Bologna, Italy (21–26 July 2013)] - Transition dynamics for Mu acceptor states in Si1–xGex alloys
Jayarathna, G., Lichti, R. L., Mengyan, P. W., Celebi, Y. G., Baker, B. B., Carroll, B. R., Yonenaga, I.Year:
2014
Language:
english
DOI:
10.1063/1.4865604
File:
PDF, 401 KB
english, 2014