Proof-of-concept framework to separate recombination...

Journal of Applied Physics 2015 / 03 Vol. 117; Iss. 10

Proof-of-concept framework to separate recombination processes in thin silicon wafers using transient free-carrier absorption spectroscopy

Siah, S. C., Winkler, M. T., Powell, D. M., Johnston, S. W., Kanevce, A., Levi, D. H., Buonassisi, T.
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Volume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4914160
Date:
March, 2015
File:
PDF, 1.32 MB
english, 2015
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