Energetic and spatial localisation of deep-level traps responsible for DC-to-RF dispersion effects in AlGaAs–GaAs HFETs
Verzellesi, G., Basile, A., Mazzanti, A., Cavallini, A., Canali, C.Volume:
39
Year:
2003
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:20030950
File:
PDF, 74 KB
english, 2003