[IEEE 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Kyoto, Japan (2015.6.4-2015.6.5)] 2015 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK) - Film thickness dependence of the micro-wall solar cell with electric-field effect
Ohki, Kohei, Kusakabe, Takashi, Matsuo, Naoto, Heya, AkiraYear:
2015
Language:
english
DOI:
10.1109/IMFEDK.2015.7158549
File:
PDF, 340 KB
english, 2015