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Analysis of Effective Gate Length Modulation by X-Ray Irradiation for Fully Depleted SOI p-MOSFETs
Kurachi, Ikuo, Kobayashi, Kazuo, Okihara, Masao, Kasai, Hiroki, Hatsui, Takaki, Hara, Kazuhiko, Miyoshi, Toshinobu, Arai, YasuoVolume:
62
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2015.2443797
Date:
August, 2015
File:
PDF, 1.61 MB
english, 2015