![](/img/cover-not-exists.png)
[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - Diagnosing timing related cell internal defects for FinFET technology
Tang, Huaxing, Tai, Ting-Pu, Cheng, Wu-Tung, Benware, Brady, Hapke, FriedrichYear:
2015
Language:
english
DOI:
10.1109/VLSI-DAT.2015.7114547
File:
PDF, 545 KB
english, 2015