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[IEEE 2015 IEEE 33rd VLSI Test Symposium (VTS) - Napa, CA, USA (2015.4.27-2015.4.29)] 2015 IEEE 33rd VLSI Test Symposium (VTS) - MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array
Kim, Woongrae, Chen, Chang-Chih, Cha, Soonyoung, Milor, LindaYear:
2015
Language:
english
DOI:
10.1109/VTS.2015.7116289
File:
PDF, 1.05 MB
english, 2015