[IEEE 2015 American Control Conference (ACC) - Chicago, IL,...

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[IEEE 2015 American Control Conference (ACC) - Chicago, IL, USA (2015.7.1-2015.7.3)] 2015 American Control Conference (ACC) - Decomposition via ADMM for scenario-based Model Predictive Control

Kang, Jia, Raghunathan, Arvind U., Cairano, Stefano Di
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Year:
2015
Language:
english
DOI:
10.1109/acc.2015.7170904
File:
PDF, 337 KB
english, 2015
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