[IEEE 30th European Solid-State Device Research Conference...

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[IEEE 30th European Solid-State Device Research Conference - Cork, Ireland (2000.9.11-2000.9.13)] 30th European Solid-State Device Research Conference - Accurate Doping Profile Extraction Near the Si/SiO2 Interface with a Novel Low Temperature C-V Technique

Pirovano, A., Lacaita, A.L., Pacelli, A., Benvenuti, A.
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Year:
2000
Language:
english
DOI:
10.1109/essderc.2000.194790
File:
PDF, 125 KB
english, 2000
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