[IEEE 30th European Solid-State Device Research Conference - Cork, Ireland (2000.9.11-2000.9.13)] 30th European Solid-State Device Research Conference - A Comparative Study of Surface and Buried P-Channel 0.10um MOSFETs
Guegan, G., Deleonibus, S., Bertrand, G., Souil, D., Clerc, R., Tedesco, S., Heitzmann, M., Mur, P.Year:
2000
Language:
english
DOI:
10.1109/essderc.2000.194835
File:
PDF, 112 KB
english, 2000