![](/img/cover-not-exists.png)
[IEEE 30th European Solid-State Device Research Conference - Cork, Ireland (2000.9.11-2000.9.13)] 30th European Solid-State Device Research Conference - Dependence of Channel Width and Length on MOSFET Matching for 0.18 um CMOS Technology
Difrenza, R., Llinares, P., Ghibaudo, G., Robillart, E., Granger, E.Year:
2000
Language:
english
DOI:
10.1109/essderc.2000.194845
File:
PDF, 345 KB
english, 2000