[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Nano Crystal Memory Devices Characterization Using the Charge Pumping Technique
Masson, P., Militaru, L., De Salvo, B., Ghibaudo, G., Celibert, V., Baron, T.Year:
2002
Language:
english
DOI:
10.1109/essderc.2002.194913
File:
PDF, 109 KB
english, 2002