[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - High Performance 0.1um CMOS Device with Suppressed Parasitic Junction Capacitance and Junction Leakage Current
H. Sik Kim,, Pandey, S.M., S. Yang Ong,, Sarkar, M., Y. Way Teh,, Benistant, F., Quek, E., Bhat, M., Chu, S.Year:
2002
DOI:
10.1109/essderc.2002.194933
File:
PDF, 248 KB
2002