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[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Electrical Characterisation of Silicon-Rich-Oxide Based Memory Cells Using Pulsed Current-Voltage Techniques
Rosmeulen, M., Sleeckx, E., De Meyer, K.Year:
2002
Language:
english
DOI:
10.1109/essderc.2002.194970
File:
PDF, 407 KB
english, 2002