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[IEEE 2014 9th European Microwave Integrated Circuits Conference (EuMIC) - Rome, Italy (2014.10.6-2014.10.7)] 2014 9th European Microwave Integrated Circuit Conference - Influence of parasitic effects of the “3ω” measurement setup to improve the determination of GaN HEMTs thermal impedance
Mustafa, Avcu, Raphael, Sommet, Raymond, QuereYear:
2014
Language:
english
DOI:
10.1109/eumic.2014.6997778
File:
PDF, 814 KB
english, 2014