[IEEE 2014 22nd International Conference on Pattern...

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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - On Effectiveness of Histogram of Oriented Gradient Features for Visible to Near Infrared Face Matching

Dhamecha, Tejas Indulal, Sharma, Praneet, Singh, Richa, Vatsa, Mayank
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Year:
2014
Language:
english
DOI:
10.1109/icpr.2014.314
File:
PDF, 1.17 MB
english, 2014
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