[IEEE 2014 22nd International Conference on Pattern...

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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - Discovering and Aligning Discriminative Mid-level Features for Image Classification

Sicre, Ronan, Jurie, Frederic
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Year:
2014
Language:
english
DOI:
10.1109/icpr.2014.345
File:
PDF, 615 KB
english, 2014
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