[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Modeling and optimization of group IV and III–V FinFETs and nano-wires
Moroz, Victor, Lee Smith,, Joanne Huang,, Munkang Choi,, Ma, Terry, Jie Liu,, Yunqiang Zhang,, Xi-Wei Lin,, Kawa, Jamil, Saad, YvesYear:
2014
Language:
english
DOI:
10.1109/iedm.2014.7047004
File:
PDF, 4.11 MB
english, 2014