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[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - A body-biasing of readout circuit for STT-RAM with improved thermal reliability
Yang, Lun, Cheng, Yuanqing, Wang, Yuhao, Yu, Hao, Zhao, Weisheng, Todri-Sanial, AidaYear:
2015
Language:
english
DOI:
10.1109/iscas.2015.7168937
File:
PDF, 442 KB
english, 2015